28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery

28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery

Blog Article

A fault-tolerant hardening-by-design frequency divider has been proposed for clock and data recovery in a 28-nm Anti Rodent Tape CMOS process.By means of the mandatory updating mechanism, the proposed divider can update the state of the D flip-flops from an error state to a correct state so as to avoid single-event transient (SET) accumulation in different finite-state machines (FSMs).Our proposed divider also does not destroy the original structure and can, thus, greatly reduce performance degradation.Laser tests show that the threshold 5 Piece Queen Crossbuck Panel Bedroom of the proposed divider can be significantly improved.

The heavy-ion experiment shows good SET/single-event upset (SEU) tolerance during the ion strike under 83.7 MeV·cm2/mg.